|Title||Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films|
|Publication Type||Journal Article|
|Year of Publication||1998|
|Authors||Fanping Kong, Robert Kostecki, Frank R McLarnon, Rolf H Muller|
|Journal||Thin Solid Films|
|Keywords||effective medium approximation, electrochemical precipitation, inhomogeneous films, nickel hydroxide, spectroscopic ellipsometry|
In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm3. The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle.