Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films

Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films

TitleSpectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films
Publication TypeJournal Article
Year of Publication1998
AuthorsFanping Kong, Robert Kostecki, Frank R McLarnon, Rolf H Muller
JournalThin Solid Films
Volume313-314
775
Pagination775-780
Date Published02/1998
Keywordseffective medium approximation, electrochemical precipitation, inhomogeneous films, nickel hydroxide, spectroscopic ellipsometry
Abstract

In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm3. The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle.

DOI10.1016/S0040-6090(97)00994-2