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Finite element modeling of piezoresponse in nanostructured ferroelectric films

Publication Type

Journal Article

Authors

Li, J.-H., L. Chen, V. Nagarajan, Ramamoorthy Ramesh, A.L. Roytburd

DOI

10.1063/1.1695641

Abstract

The converse piezoresponse measured by the surface displacement of ferroelectric islands, with lateral size changing from a nanoscale to a continuous film was modeled by using three-dimensional finite element method. It was shown that the piezodeformation of the islands results in a local deformation of a substrate in the vicinity of island. The piezoresponse of different size island capacitors with PbZr 0.5Ti 0.5O 3/SrTiO 3/Si and PbZr 0.2Ti 0.8O 3/SrTiO 3 heterostructures was also calculated. The patterning thin ferroelectric films into discrete islands was an effective way to release the constraint imposed by a substrate.

Journal

Applied Physics Letters

Volume

Year of Publication

2004

ISSN

00036951

Notes

cited By 56

Research Areas

Ramesh Lab