Dr. Rick E. Russo has studied fundamental properties of laser material interactions and related applications for over 25 years. Dr. Russo earned a B.S. degree in Chemistry at the University of Florida (1976), and received his Ph.D. in Chemistry from Indiana University (1981), where he also completed his postdoctoral studies. Since 1982, he has held various positions at the Lawrence Berkeley National Laboratory in Berkeley, California, where he is currently a Senior Scientist. His background includes experience with state-of-the-art lasers, spectroscopic instrumentation, imaging systems, computers, and electronics. His research has included: fundamental studies of laser heating and laser ablation processes; improved chemical analysis using laser ablation inductively coupled plasma mass spectrometry; study and fabrication of high-temperature superconductor (HTSC) thin-films; fiber sensors for monitoring organic and radioactive species in groundwater; Raman, fluorescence, and photothermal spectroscopy of rare-earth and actinide ions; acoustic monitoring with optical fibers (laser ultrasonics, non-destructive evaluation); and the fabrication of porous optical materials (aerogels). He is co-inventor of the ion-assisted pulsed laser deposition (IBAD) and ion-texturing (ITEX) processes, and holds the world record for the highest critical current density (Jc) HTSC film on polycrystalline substrate (1992). Dr. Russo is co-discoverer of the nanowire laser, highlighted by a Science article and patent application in 2002. His credits include 200 scientific publications; 48 proceedings; 176 presentations (91 invited and plenary); 10 book chapters, 9 patents, and R&D100 award in 2006.
Richard Russo, Arnab Sarkar, Xianglei Mao, and George Chan
Richard Russo, Xianglei Mao, Dale Perry, Inhee Choi and colleagues at Applied Spectra and NASA
Richard E. Russo
Rick Russo and Xianglei Mao, Environmental Energy Technologies Division, Osman Sorkhabi, LAM Research Corp., and Alexander Bol'shakov, Applied Spectra
Paul Ridgway and Richard Russo, EETD, and Emmanuel Lafond, Institute of Paper Science and Technology at Georgia Tech